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Assistant Professor Martial Duchamp


Email: mduchamp@ntu.edu.sg
Phone: (+65) 6316 8980
Office: N4.1-02-14
Related Links: http://www.ntu.edu.sg/home/mduchamp/

Current Research Interests

  1. Development of Transmission Electron Microscopy (TEM) techniques
  2. In-situ and in-operando TEM experiments of electrically contacted devices
  3. Low temperature TEM experiments
  4. Study of 2D-materials including graphene and 2D TMDS in-situ a TEM
  5. Applications of various TEM techniques to material science problems.


Biographical Information

Dr. Martial Duchamp received his Master of Engineering and Research degree from the Ecole Nationale Supérieure de Physique, Grenoble (ENSPG-INPG), France in 2005 and a Ph.D. degree from the Physic department at the Ecole Polytechnique Fédérale Lausanne (EPFL), Switzerland in 2009, where he studied the growth, electrical and mechanical properties of ZnO nanowires. After postdoctoral research at Danmarks Tekniske Universitet (DTU), Copenhagen, Denmark, he joined the Research Center Jülich in The Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) institute in 2011, where he investigated solar cells using various TEM techniques, mainly focusing on the chemical analysis of very low dopant concentrations and in-situ TEM experiments. In 2016, he joined NTU as an Assistant Professor.

Selected Publications

A. Grimaud, A. Demortiere, M. Saubanere, W. Dachraoui, M. Duchamp, M.-L. Doublet and Jean-Marie Tarascon, Activation of surface oxygen sites on an iridium-based model catalyst for the oxygen evolution reaction, Nature Energy 2 (2016) 16189 doi: 110.1038/nenergy.2016.189

Q. Jeangros, M. Duchamp, J. Werner, M. Kruth, R.E. Dunin-Borkowski, B. Niesen, C. Ballif and A. Hessler-Wyser, In situ TEM analysis of organic-inorganic metal-halide perovskite solar cells under electrical bias, Nanoletters 11 (2016) 7013 doi: 10.1021/acs.nanolett.6b03158

M. Duchamp, V. Migunov, A. Tavabi, A. Mehomic, M. Munde, A.J. Kenyon, R.E. Dunin-Borkowski, Advances in in-situ TEM characterization of silicon oxide resistive switching memories Resolution and Discovery 1 (2016) 27
doi: 10.1556/2051.2016.00036

F. Winkler, A.H. Tavabi, J. Barthel, M. Duchamp, E. Yucelen, S. Borghardt, B. Kardynal, R.E. Dunin-Borkowski, Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2 Ultramicroscopy (2016)
doi: 10.1016/j.ultramic.2016.07.016

M. Duchamp, Q. Xu, R.E.  Dunin-Borkowski, Convenient preparation of high quality specimens for annealing experiments in the transmission electron microscope Microsc. Microanal. 20 (2014) 1638
doi: 10.1017/S1431927614013476

M. Duchamp, M. Lachmann, C.B. Boothroyd, A. Kovàcs, F.-J. Haug, C. Ballif and R.E. Dunin-Borkowski, Compositional study of defects in microcrystalline silicon solar cells using spectral decomposition in the scanning transmission electron microscope Appl. Phys. Lett. 102 (2013) 133902 doi: 10.1063/1.4800569

M. Duchamp, K. Lee, B. Dwir, J. W. Seo, E. Kapon, L. Forró and A. Magrez, Controlling the positioning of carbon nanotubes by dielectrophoresis: Insights into the solvent and the substrate role ACS Nano 4 (2010) 279​​