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FACILITIES: Electron Microcopy & X-Ray Diffraction
Lab
Location:
N4.1-B4-10
Tel: (65) 6790 6158
Contact Person:
Wang Lee Chin (Ms)
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Transmission Electron Microscope
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This sophisticated lab also goes by the name Facility for Analysis, Characterisation, Testing and Simulation (FACTS).Its role is to provide research support and advanced facilities for staff, postgraduate and undergraduate students in the areas of electron microscopy and microanalysis, as well as x-ray diffraction analysis.
This central facility is also open to scientists and engineers from the National University of Singapore, private companies and A*Star research institutes. The lab’s technicians provide basic training on the Transmission Electron Microscope (TEM), X-Ray Diffractometer (XRD), Scanning Electron Microscope (SEM) and XRF (X-Ray Fluorescence), while MSE’s Professor Tim White provides more advanced immersion courses on TEM and XRD.
Major
Equipment
- Transmission
Electron Microscope (Jeol JEM 2010) equipped
with EDX and PEELS
- Field
Emission Scanning Electron Microscope (Jeol
JSM 6340F) equipped with EDX
- Low
Vacuum Scanning Electron Microscope (Jeol JSM
5410LV) equipped with EDX and EBSD
- Scanning
Electron Microscope (Jeol JSM 5310) equipped
with EDX
- X-Ray
Diffractometer (Shimadzu 6000)
- X-Ray
Diffractometer (Rigaku Dmax 2200) equipped
with:
- Thin
Film attachment
- Pole
Figure attachment
- High
Temperature attachment
- Residual
Stress attachment
- Supporting
Sample Preparation Equipment
- High
precision ion millers (Gatan 691)
- Ultrasonic
disk cutter (Gatan 601)
- Dimple
grinders (Gatan 656)
- Electrolytic
polishers (Fischione 120)
- Carbon
/ gold coaters (SPI-Module)
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